New equipment – Imaging And Histology Core Facility
In May 2013 the IHCF acquired a new cutting edge SEM, a Zeiss Supra 40VP variable pressure field emission scanning electron microscope. The SEM is equipped with eight different detectors to facilitate
- secondary and backscattered electron imaging
- energy dispersive (EDS) and wavelength dispersive (WDS) x-ray microanalysis
- scanning transmission electron microscopy (STEM)
- variable pressure secondary electron imaging which permits non-conducting and wet specimen analysis
The SEM possesses 1.5 nm resolution capability and up to 0.8 nm resolution with STEM.
Funding for the new SEM was provided by the National Science Foundation (NSF DBI:1229740).